RAMAN SPECTROSCOPY

To observe vibrational, rotational and other low-frequency modes in a system.

XRAY DIFFRACTOMETER (XRD)

for phase identification & percent crystallinity material .

BALLMILLER

grinding, blending, and homogenizing materials into fine powders or nanoparticles.

BET

measures the specific surface area of solids by gas adsorption, using the classic Brunauer‑Emmett‑Teller theory (BET) method. It also determines pore size distribution, pore volume, and related porosity characteristics of materials
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HALL EFFECT

Measures the electrical transport properties of materials — specifically the Hall effect, which gives insight into carrier type, carrier concentration, and mobility in semiconductors, thin films, and electronic materials.
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IPCE

Measures the incident photon‑to‑current efficiency (IPCE), also called external quantum efficiency (EQE), of photovoltaic devices — that is, how many electrons are generated per incident photon for a given wavelength.
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PORTABLE SOLAR SIMULATOR

Provides simulated sunlight (AM1.5G spectrum) to test photovoltaic devices under controlled conditions. For small-scale, portable testing of solar cells, including lab-scale solar devices like DSSCs, perovskite, or organic solar cells.
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FOUR POINT PROBE

measure the electrical resistivity or sheet resistance of materials — typically semiconductors, thin films, and coatings.
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BENCHTOP SURFACE PROFILER

measure and characterise the topography of material surfaces, including: profile of features (valleys, peaks, scratches) and step height (difference between layers or films)
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CONTACT ANGLE

Measures the contact angle of a liquid droplet on a solid surface to determine wettability, hydrophobicity/hydrophilicity, and surface energy.
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3D PRINTER

create three-dimensional solid objects from a digital 3D model by depositing materials layer by layer.

THERMAL EVAPORATOR

used for thin‑film deposition of metals, organics or other materials by thermal (resistive) evaporation under high/ultra‑high vacuum conditions.
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DIAMOND CUTTING SAW

Used to cut, section, or dice hard materials such as metals, ceramics, semiconductors, glass, composites, and crystals.

HIGH END OSCILLOSCOPE

A high‑performance digital oscilloscope designed to measure, visualize and analyze electrical waveforms and their behaviors over time (voltage vs. time) for up to four analog channels.
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SEMICONDUCTOR PARAMETRIC ANALYZER

Used for electrical characterization of semiconductor devices, such as MOSFETs, diodes, thin-film devices, sensors, and emerging semiconductor materials.
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