ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY

To investigate properties of materials and electrode

FTIR SPECTROMETER

to obtain an infrared spectrum of absorption or emission of a solid, liquid or gas.

PROBE STATION FOR LOW CURRENT MEASUREMENT

Nano characterization System for Low current

TABLE TOP MICROSCOPE

- Funtionally as a Scanning Electron Microscope - Record sample images at magnification up to 10 000x - Capture and measure samples directly without having to go through the standard sample processing process (gold caoted) - Samples were analyzed in full vacuum
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ADVANCE RESEARCH STEREO MICROSCOPE

- Funtionally of capturing images using Nikon AZ100M software - Capture sample images 5x, 1x, 0.5x (macro images) - Record and measure sample in a living or coloured sample on a glass slide or petri disc. - Ability to capture sample images as follows: a) Differential Interference Contrast (DIC) b) Bright Field Images
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MEASURING MICROSCOPE

To observe, capture, measure and process the image of the sample

AUTOMATED PARTICAL SAMPLING SYSTEM

Use to count the number of particles in sample

HIGH PERFORMANCE LIQUID CHROMATOGRAPHY

VARIABLE WAVELENGTH DETECTOR USING OPENLAB CHEMSTATION SOFTWARE

INVERTED MICROSCOPE

Fully motorized. Use to capture and measure sample with inverted microscope lense, detect the fluorescent sample and doing the life sample observation by using CO2 incubator.
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MARINE ENGINE TEST BEDS

Testing of efficiency of the engine based on type of fuel used.

5-AXIS SHIP MODEL MILLING MACHINE

Modelling and Prototyping up to 4meter long and 2meter wide

AUTOMATED SOIL CO2 FLUX SYSTEM SURVEY

The equipment is used to measure CO2 flux from soil

INDUCTIVE COUPLE PLASMA SPECTROMETER (ICP-OES)

Determination of element in soil, plant materials, and plant-based product

WALK-IN CHAMBER (TEMPERATURE & HUMIDITY)

Conditioning Samples.

ATOMIC FORCE MICROSCOPY (AFM)

The Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. Surface imaging on nanoscale
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