MIX - Signal Tester.
Automatic Wafer Prober. Wafer Handler
Applications-General Purpose.
Manufacturing test set for multi technology solution. It support 3GPP standards (LTE,WCDMA, GSM), CDMA2000 1xRTT and CDM
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2-ports Network analyzer, 10 MHz to 26.5 GHz. With 130 dB receiver dynamic range and high output power (+18 dBm), low ha
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Wideband signaling test equipment for multi-technology like 3GPP standards (LTE, WCDMA, GSM), CDMA2000 1xRTT and CDMA200
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Vector Network Analyser, 4-port, 50 ohm, S-parameter test set.
Oscilloscope catering to motor analysis.
Dual Domain. Two-channel analog input/output, analog analyzer and generator, DSP analyzer and generator, plus 192k digit
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RF Spectrum Analyzer (BSA), 9kHz to 3 GHz.
Semiconductor Device Parameter Analyzer/semiconductor Characterization System.
VIRTUAL REALITY SYSTEM
3D LASER SCANNING
Netlist-to-GDSII implementation system. Netlist-to-GDSII implementation system
Static timing and cross talk analyzer. Static timing and cross talk analyzer
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