HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE (HRTEM 200KV)

The facility is equipped with TEM which is often used to obtain detailed images of the internal structures of specimens

X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)

The AXIS UltraDLD provides the latest generation tool for high sensitivity muti-technique electron spectroscopy. Spectra may be acquired in either scanned or rapid un scanned or rapid un-scanned scanned ‘snapshot snapshot’ mode by mode by using the delay-line detector (DLD). A quantitative analysis tool that can provide the elemental composition (excluding hydrogen) and information on chemical bonding environments and oxidation states within the upper 1-10 nm of the surface and reveal relative ratios or atoms of co-existing chemical states. XPS can offer: • Survey Spectra The number of electrons is plotted as a function of binding energy to produce survey spectra. These spectra show the elemental composition of the surface (excluding hydrogen and helium). • High Resolution Spectra The binding energy of a photoelectron reflects the bonding environment it was emitted from. Accurate measurement of peak positions after deconvolution of high resolution spectra provides quantitative chemical state information.
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RAMAN LABRAM HR EVOLUTION (RAMAN)

Raman spectroscopy can provide key information about chemical composition and material structure. The Raman effect results from the interaction of laser light with molecular vibrations within the sample, and is highly sensitive to small changes in chemistry and molecular environment. Raman Labram HR Evolution laser wavelengths Wavelenght is 325nm and 633nm.
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RAMAN XPLORA PLUS (RAMAN-AFM)

The platform integrates Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques and confocal optical spectroscopy (Raman and fluorescence imaging) in one versatile instrument, for fast simultaneous co-localized measurements and Tip-Enhanced Raman Spectroscopy (TERS). Raman Xplora Plus laser wavelengths is 532nm and 785nm.
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ATOMIC FORCE MICROSCOPY (AFM)

It is operate on the principle of surface sensing using this nanoscale sharp tip on a micromachined silicon probe name cantilever. This tip is used to image a sample by raster scanning across the surface line by line, although the method varies dramatically between distinct operating modes. The operating modes are widely defined as contact mode, non contact mode and tapping mode. It is possible to measure the surface features of samples with atomic resolution for topographical measurements and imaging applications such as roughness of the sample.
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DIFFERENTIAL SCANNING CALORIMETERS (DSC)

Heat flow in and out of a sample and a reference material, is measured as a function of temperature as the sample is heated, cooled or held isothermally at constant temperature. The measurement signal is the energy absorbed by or released by the sample in milliwatts.
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SMALL ANGLE X-RAY SCATTERING (SAXS)

A technique where the elastic scattering of X-rays (wavelength 0.2 nm) by a sample which has inhomogeneities in the nm-range, is recorded at very low angles (typically 0.1 - 10°). This angular range contains information about the shape and size of macromolecules, characteristic distances of partially ordered materials, pore sizes, and other data. SAXS is capable of delivering structural information of macromolecules between 5 and 25 nm, of repeat distances in partially ordered systems of up to 150 nm.
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X-RAY DIFFRACTOMETER (BASIC)

A technique used to determine the atomic and molecular structure of a crystal, in which the crystalline atoms cause a beam of incident X-rays to diffract into many specific directions.
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X-RAY DIFFRACTOMETER (MULTI PURPOSE)

A technique used to determine the atomic and molecular structure of a crystal, in which the crystalline atoms cause a beam of incident X-rays to diffract into many specific directions.
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SINGLE CRYSTAL X-RAY DIFFRACTION (SC-XRD)

Single crystal X-ray diffraction Is a non-destructive analytical technique which allow for absolute information on the internal lattice of crystalline substances, including bond distances, bond orders, bond angles, shapes of coordination polyhedral, conformations of flexible molecules, as well as intermolecular contacts.
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CARBON, HYDROGEN, NITROGEN & SULPHUR ANALYSER(CHNS)

CHNS elemental analyzer provides a means for the rapid determination of the total concentration of carbon, hydrogen, nitrogen, and sulfur in organic matrices and other types of materials—application for carbon materials, organic waste material; palm oil pulp.
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MICRO DIFFERENTIAL SCANNING CALORIMETER (U-DSC)

u-DSC is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature. The unit can measure in the pressurized environment up to 150 bar. The temperature range for the equipment is from -20ËšC to 100ËšC under nitrogen gas flow. From the DSC analysis, we are able to retrieve the glass transition temperature, crystallization, and melting temperature of the interest sample. Application for hydrates.
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ATOMIC ABSORPTION SPECTROSCOPY (AAS)

Menganalisa kehadiran kandungan logam berat yang terdapat di dalam air, makanan, tanah.

FREEZE DRYER

removes water from a perishable material in order to preserve it

HPTLC FULL SET (ATS 4, ADC 2, SCANNER 4, VISUALIZER, AMD 2,IMMERSION 3,UV LAMP)

automated thin layer chromatography method including sample application (loading), plate development, detection and documentation
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