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National Scientific Facilities & Equipment

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INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER (ICP-MS)

The Inductively Coupled Plasma Mass Spectrometer (ICP-MS) is a highly sensitive analytical instrument that detects and q
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LASER PARTICLE SIZE ANALYZER (LPSA)

The Laser Particle Size Analyzer (LPSA) measures particle size distribution by analyzing light scattering from particles
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LIQUID CHROMATOGRAPHY HIGH RESOLUTION ACCURATE-MASS SPECTROMETRY (LC-HRMS)

Liquid Chromatography–High Resolution Accurate-Mass Spectrometry (LC-HRMS) combines precise chromatographic separation w
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MIVAC CENTRIFUGAL CONCENTRATOR

The MiVac Centrifugal Concentrator rapidly evaporates solvents from samples under vacuum and centrifugal force, enabling
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NANO PARTICLE SIZE ANALYZER (NPSA)

The Nano Particle Size Analyzer (NPSA) measures the size, distribution, and stability of nanoparticles in solutions or s
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PHOTOLUMINESCENCE SPECTROMETER (PL)

The Photoluminescence Spectrometer (PL) analyzes light emission from materials after excitation, providing insights into
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PLASMA CLEANER

The Plasma Cleaner uses ionized gas (plasma) to remove organic contaminants from surfaces, enhancing cleanliness and sur
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AUTOMATIC POLARIMETER (POLARIMETER)

The Automatic Polarimeter measures the optical rotation of chiral compounds by analyzing the rotation of plane-polarized
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RAMAN SPECTROMETER (RAMAN)

The Raman Spectrometer analyzes vibrational, rotational, and molecular modes by measuring inelastically scattered light,
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SINGLE CRYSTAL X-RAY DIFFRACTOMETER (SC-XRD)

The Single Crystal X-Ray Diffractometer (SC-XRD) determines precise three-dimensional molecular and crystal structures b
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SPUTTER COATER (GOLD)

The Sputter Coater (Gold) deposits a thin conductive gold layer onto non-conductive samples, enhancing surface conductiv
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SPUTTER COATER (PLATINUM)

The Sputter Coater (Platinum) applies a thin, uniform platinum layer onto non-conductive samples, improving surface cond
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SPUTTER COATER (IRIDIUM)

The Sputter Coater (Iridium) deposits a thin iridium layer onto non-conductive samples, enhancing surface conductivity a
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SIMULTANEOUS THERMAL ANALYZER (STA)

The Simultaneous Thermal Analyzer (STA) simultaneously measures weight changes and heat flow in materials under controll
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TRANSMISSION ELECTRON MICROSCOPE (TEM)

The Transmission Electron Microscope (TEM) uses a high-energy electron beam transmitted through ultra-thin samples to pr
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