SPUTTER COATER (GOLD)

The Sputter Coater (Gold) deposits a thin conductive gold layer onto non-conductive samples, enhancing surface conductivity and imaging quality for electron microscopy, ensuring high-resolution visualization in materials science, nanotechnology, biology, and semiconductor research.
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SPUTTER COATER (PLATINUM)

The Sputter Coater (Platinum) applies a thin, uniform platinum layer onto non-conductive samples, improving surface conductivity and imaging quality for electron microscopy, enabling high-resolution observation in materials science, nanotechnology, biology, and semiconductor research.
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SPUTTER COATER (IRIDIUM)

The Sputter Coater (Iridium) deposits a thin iridium layer onto non-conductive samples, enhancing surface conductivity and resolution for electron microscopy, enabling detailed imaging in materials science, nanotechnology, biology, and semiconductor research without compromising fine structural features.
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SIMULTANEOUS THERMAL ANALYZER (STA)

The Simultaneous Thermal Analyzer (STA) simultaneously measures weight changes and heat flow in materials under controlled temperature, enabling analysis of thermal stability, decomposition, phase transitions, and reaction kinetics, essential for polymers, pharmaceuticals, composites, and material science research.
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TRANSMISSION ELECTRON MICROSCOPE (TEM)

The Transmission Electron Microscope (TEM) uses a high-energy electron beam transmitted through ultra-thin samples to produce high-resolution images, enabling detailed analysis of internal structures, morphology, crystallography, and nanostructures in materials science, biology, and nanotechnology research.
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ULTRAVIOLET/VISIBLE/NEAR INFRARED SPECTROMETER (UV-VIS NIR)

The Ultraviolet/Visible/Near Infrared (UV-VIS-NIR) Spectrometer measures light absorption across UV, visible, and near-infrared wavelengths, providing information on electronic transitions, concentration, and optical properties of molecules, essential for material characterization, chemical analysis, pharmaceuticals, and research applications.
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X-RAY DIFFRACTOMETER 1 POWDER 9 (XRD)

The X-Ray Diffractometer (XRD) analyzes crystalline materials by measuring diffraction patterns of X-rays interacting with powdered samples, providing information on phase identification, crystal structure, lattice parameters, and crystallinity, essential for materials science, chemistry, pharmaceuticals, and geological research.
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X-RAY DIFFRACTOMETER 2 POWDER 45 (XRD)

The X-Ray Diffractometer (XRD) analyzes crystalline materials by measuring diffraction patterns of X-rays interacting with powdered samples, providing information on phase identification, crystal structure, lattice parameters, and crystallinity, essential for materials science, chemistry, pharmaceuticals, and geological research.
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X-RAY DIFFRACTOMETER 3 THIN FILM (XRD)

The X-Ray Diffractometer for Thin Films (XRD) analyzes the structural properties of thin films and coatings by measuring X-ray diffraction, providing insights into crystal orientation, phase composition, thickness, and strain, essential for materials science, semiconductors, and surface engineering research.
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X-RAY FLUORESCENCE SPECTROMETER (XRF)

The X-Ray Fluorescence Spectrometer (XRF) identifies and quantifies elemental composition by measuring characteristic X-rays emitted from a sample, enabling rapid, non-destructive analysis of metals, minerals, soils, and industrial materials for quality control, research, and environmental applications.
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X-RAY PHOTOELECTRON SPECTROMETER (XPS)

The X-Ray Photoelectron Spectrometer (XPS) analyzes the elemental composition and chemical states of a material’s surface by detecting photoelectrons emitted upon X-ray irradiation, providing critical insights for surface chemistry, coatings, catalysts, semiconductors, and materials science research.
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WOBBE INDEX DETERMINATION UNIT CWD2005

Device for measuring the Wobbe Index, which indicates the interchangeability and quality of fuel gases.

HIGH SPEED CAMERA

Captures extremely fast events in high resolution for analysis of motion, combustion, or material behavior.

CALORIFIC VALUE BOMB CALORIMETER

Measures the heat of combustion of a fuel sample to determine its calorific value (energy content).

DIFFERENTIAL SCANNING CALORIMETRY (DSC)

Measures heat flow associated with thermal transitions in materials (e.g., melting, glass transition).