NANO PARTICLE SIZE ANALYZER (NPSA)

The Nano Particle Size Analyzer (NPSA) measures the size, distribution, and stability of nanoparticles in solutions or suspensions, providing precise characterization essential for nanotechnology, pharmaceuticals, materials science, and quality control in research and industrial applications.
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PHOTOLUMINESCENCE SPECTROMETER (PL)

The Photoluminescence Spectrometer (PL) analyzes light emission from materials after excitation, providing insights into electronic structure, energy states, defects, and optical properties, crucial for characterizing semiconductors, nanomaterials, LEDs, quantum dots, and other photonic or luminescent materials.
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PLASMA CLEANER

The Plasma Cleaner uses ionized gas (plasma) to remove organic contaminants from surfaces, enhancing cleanliness and surface energy. It is essential for sample preparation in microscopy, semiconductor fabrication, nanotechnology, and material science, ensuring improved adhesion, imaging, and analytical performance.
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AUTOMATIC POLARIMETER (POLARIMETER)

The Automatic Polarimeter measures the optical rotation of chiral compounds by analyzing the rotation of plane-polarized light, enabling determination of concentration, purity, and stereochemistry of sugars, pharmaceuticals, and other optically active substances in research and quality control.
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RAMAN SPECTROMETER (RAMAN)

The Raman Spectrometer analyzes vibrational, rotational, and molecular modes by measuring inelastically scattered light, providing detailed chemical and structural information. It is widely used for material characterization, pharmaceuticals, nanomaterials, polymers, and research in chemistry and materials science.
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SINGLE CRYSTAL X-RAY DIFFRACTOMETER (SC-XRD)

The Single Crystal X-Ray Diffractometer (SC-XRD) determines precise three-dimensional molecular and crystal structures by analyzing X-ray diffraction patterns from single crystals, providing essential information on atomic positions, bond lengths, angles, and packing, crucial for chemistry, materials science, and pharmaceutical research.
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SPUTTER COATER (GOLD)

The Sputter Coater (Gold) deposits a thin conductive gold layer onto non-conductive samples, enhancing surface conductivity and imaging quality for electron microscopy, ensuring high-resolution visualization in materials science, nanotechnology, biology, and semiconductor research.
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SPUTTER COATER (PLATINUM)

The Sputter Coater (Platinum) applies a thin, uniform platinum layer onto non-conductive samples, improving surface conductivity and imaging quality for electron microscopy, enabling high-resolution observation in materials science, nanotechnology, biology, and semiconductor research.
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SPUTTER COATER (IRIDIUM)

The Sputter Coater (Iridium) deposits a thin iridium layer onto non-conductive samples, enhancing surface conductivity and resolution for electron microscopy, enabling detailed imaging in materials science, nanotechnology, biology, and semiconductor research without compromising fine structural features.
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SIMULTANEOUS THERMAL ANALYZER (STA)

The Simultaneous Thermal Analyzer (STA) simultaneously measures weight changes and heat flow in materials under controlled temperature, enabling analysis of thermal stability, decomposition, phase transitions, and reaction kinetics, essential for polymers, pharmaceuticals, composites, and material science research.
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TRANSMISSION ELECTRON MICROSCOPE (TEM)

The Transmission Electron Microscope (TEM) uses a high-energy electron beam transmitted through ultra-thin samples to produce high-resolution images, enabling detailed analysis of internal structures, morphology, crystallography, and nanostructures in materials science, biology, and nanotechnology research.
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ULTRAVIOLET/VISIBLE/NEAR INFRARED SPECTROMETER (UV-VIS NIR)

The Ultraviolet/Visible/Near Infrared (UV-VIS-NIR) Spectrometer measures light absorption across UV, visible, and near-infrared wavelengths, providing information on electronic transitions, concentration, and optical properties of molecules, essential for material characterization, chemical analysis, pharmaceuticals, and research applications.
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X-RAY DIFFRACTOMETER 1 POWDER 9 (XRD)

The X-Ray Diffractometer (XRD) analyzes crystalline materials by measuring diffraction patterns of X-rays interacting with powdered samples, providing information on phase identification, crystal structure, lattice parameters, and crystallinity, essential for materials science, chemistry, pharmaceuticals, and geological research.
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X-RAY DIFFRACTOMETER 2 POWDER 45 (XRD)

The X-Ray Diffractometer (XRD) analyzes crystalline materials by measuring diffraction patterns of X-rays interacting with powdered samples, providing information on phase identification, crystal structure, lattice parameters, and crystallinity, essential for materials science, chemistry, pharmaceuticals, and geological research.
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X-RAY DIFFRACTOMETER 3 THIN FILM (XRD)

The X-Ray Diffractometer for Thin Films (XRD) analyzes the structural properties of thin films and coatings by measuring X-ray diffraction, providing insights into crystal orientation, phase composition, thickness, and strain, essential for materials science, semiconductors, and surface engineering research.
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