HIGH END OSCILLOSCOPE

A high‑performance digital oscilloscope designed to measure, visualize and analyze electrical waveforms and their behaviors over time (voltage vs. time) for up to four analog channels.
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SEMICONDUCTOR PARAMETRIC ANALYZER

Used for electrical characterization of semiconductor devices, such as MOSFETs, diodes, thin-film devices, sensors, and emerging semiconductor materials.
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IMPEDANCE ANALYZER

Measures the complex electrical impedance of components, materials or circuits as a function of frequency.

MUSE CELL ANALYZER

A benchtop flow cytometry-based system for cell counting, viability, apoptosis, and cell cycle analysis.

NANOINDENTER

measures how materials respond mechanically (hardness, modulus, creep, etc.) at very small scales (nanometres to micrometres).
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SPECTROMETER (EDX)

Detects and analyzes the elemental composition of a sample.