FOUR POINT PROBE

measure the electrical resistivity or sheet resistance of materials — typically semiconductors, thin films, and coatings.
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BENCHTOP SURFACE PROFILER

measure and characterise the topography of material surfaces, including: profile of features (valleys, peaks, scratches) and step height (difference between layers or films)
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CONTACT ANGLE

Measures the contact angle of a liquid droplet on a solid surface to determine wettability, hydrophobicity/hydrophilicity, and surface energy.
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3D PRINTER

create three-dimensional solid objects from a digital 3D model by depositing materials layer by layer.

THERMAL EVAPORATOR

used for thin‑film deposition of metals, organics or other materials by thermal (resistive) evaporation under high/ultra‑high vacuum conditions.
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DIAMOND CUTTING SAW

Used to cut, section, or dice hard materials such as metals, ceramics, semiconductors, glass, composites, and crystals.

HIGH END OSCILLOSCOPE

A high‑performance digital oscilloscope designed to measure, visualize and analyze electrical waveforms and their behaviors over time (voltage vs. time) for up to four analog channels.
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SEMICONDUCTOR PARAMETRIC ANALYZER

Used for electrical characterization of semiconductor devices, such as MOSFETs, diodes, thin-film devices, sensors, and emerging semiconductor materials.
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IMPEDANCE ANALYZER

Measures the complex electrical impedance of components, materials or circuits as a function of frequency.

MUSE CELL ANALYZER

A benchtop flow cytometry-based system for cell counting, viability, apoptosis, and cell cycle analysis.

NANOINDENTER

measures how materials respond mechanically (hardness, modulus, creep, etc.) at very small scales (nanometres to micrometres).
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SPECTROMETER (EDX)

Detects and analyzes the elemental composition of a sample.